منابع مشابه
Built-In Self Test
BIST is a technique aimed to: Avoiding the usage of expensive ATE Increase the fault tolerance since it add more access to the internal points Allow the application of at-speed test and reduce the test time. It is mandatory to consider the BIST as a test solution when the design flow and the design area can afford it.
متن کاملSelf-awareness, self-evaluation, and creativity.
The present research examined when self-evaluation influences creativity. Based on objective self-awareness theory, the authors predicted that feeling able to improve would buffer against the detrimental effects of self-evaluation on creativity. Two experiments manipulated self-evaluation (varying self-awareness, Study 1; providing objective performance standards, Study 2) and perceived ability...
متن کاملMems Built–in-self-test Using Mls Mems Built–in-self-test Using Mls
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro ElectroMechanical Systems (MEMS). The technique is based on Impulse Response (IR) evaluation using Maximum–Length Sequences (MLS). We will demonstrate the use of this technique and move forward to find the signature that is defined as the necessary samples of the impulse response needed to carry ou...
متن کاملOn Built-In Self-Test for Adders
We evaluate some previously proposed test approaches for various types of adders in an attempt to find an architecture-independent algorithm for testing adders in embedded Digital Signal Processors (DSPs) in Field Programmable Gate Arrays (FPGAs). We find that a minor modification to a previously proposed Built-In Self-Test (BIST) approach provides the highest fault coverage for most types of a...
متن کاملScalable Deterministic Logic Built-In Self-Test
The core-based design style of integrated circuits (ICs) helps to manage the development challenges brought by the ever increasing complexity of integrated systems and the ever tighter time-to-market. Nevertheless, test-related problems are still far away from having a unitary and satisfactory solution, especially in the system on a chip (SOC) context. For the test of ICs two reference approach...
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ژورنال
عنوان ژورنال: Nature
سال: 2016
ISSN: 0028-0836,1476-4687
DOI: 10.1038/532313d